Increasing the Sensitivity of Cumulative Quantity Control Chart Using Runs Rules
DOI:
https://doi.org/10.64497/jssci.127Keywords:
cumulative quantity, high yield, average run length, Markov chain, control chartAbstract
In high-yield processes, the Shewhart type c-chart and u-chart are applicable for monitoring the rate of nonconformities. However, the effectiveness of these control charts diminishes significantly when the nonconformity rate is extremely low. To overcome the limitations of the c-chart, the cumulative quantity control chart is recommended for scenarios where the defect rate is very low. In this article, the m-of-m cumulative quantity control chart is proposed to improve the performance of the cumulative quantity control chart. The proposed control chart is designed to detect upward, downward, and both sided shifts in a process parameter. The Markov chain approach is used to compute the average run length of the proposed m-of-m control charts. A comparative analysis has been conducted to identify the most effective control chart. The performance of the proposed control charts is found to be superior to that of the cumulative quantity control chart in detecting upward shifts, while it is less effective for downward shifts. The practical application of the proposed control chart is demonstrated through an example.
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